Title :
Defect-free manufacturing in the nineties
Author :
Raheja, Dev G. ; Lindsley, Michelle L.
Author_Institution :
Technol. Manage. Inc., Laurel, MD, USA
Abstract :
Some techniques for defect-free manufacturing for the 1990s are presented, along with case histories. Particular attention is given to such techniques as process failure modes and effects analysis, fault-tree analysis, and process analysis mappings
Keywords :
electronic equipment manufacture; failure analysis; quality control; reliability; 1990s; QC; aerospace components; defect-free manufacturing; effects analysis; fault-tree analysis; process analysis mappings; process failure; reliability; Availability; Control systems; Failure analysis; History; Manufacturing industries; Manufacturing processes; Process control; Process design; Product design; Quality function deployment;
Conference_Titel :
Aerospace and Electronics Conference, 1991. NAECON 1991., Proceedings of the IEEE 1991 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-0085-8
DOI :
10.1109/NAECON.1991.165882
