DocumentCode :
2300770
Title :
On the Chernoff distance for asymptotic LOCC discrimination of bipartite quantum states
Author :
Matthews, William ; Winter, Andreas
Author_Institution :
Dept. of Math., Univ. of Bristol, Bristol
fYear :
2008
fDate :
5-9 May 2008
Firstpage :
364
Lastpage :
367
Abstract :
Motivated by the recent discovery of a quantum Chernoff theorem for asymptotic state discrimination, we investigate the distinguishability of two bipartite mixed states under the constraint of local operations and classical communication (LOCC), in the limit of many copies. While for two pure states a result of Walgate et al. shows that LOCC is just as powerful as global measurements, data hiding states (DiVincenzo et al.) show that locality can impose severe restrictions on the distinguishability of even orthogonal states. Here we determine the optimal error probability and measurement to discriminate many copies of particular data hiding states (extremal d times d Werner states) by a linear programming approach. Surprisingly, the single-copy optimal measurement remains optimal for n copies, in the sense that the best strategy is measuring each copy separately, followed by a simple classical decision rule. We also put a lower bound on the bias with which states can be distinguished by separable operations. This is a shortened version of a paper [1] recently submitted to Communications in Mathematical Physics; here the proofs have been omitted.
Keywords :
error statistics; linear programming; quantum communication; Chernoff distance; asymptotic LOCC discrimination; asymptotic state discrimination; bipartite mixed states; bipartite quantum states; data hiding states; linear programming approach; local operations and classical communication; optimal error probability; Constraint theory; Data analysis; Data encapsulation; Drives; Error probability; Linear programming; Mathematics; Particle measurements; Physics; Quantum mechanics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Theory Workshop, 2008. ITW '08. IEEE
Conference_Location :
Porto
Print_ISBN :
978-1-4244-2269-2
Electronic_ISBN :
978-1-4244-2271-5
Type :
conf
DOI :
10.1109/ITW.2008.4578687
Filename :
4578687
Link To Document :
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