DocumentCode
2301129
Title
Compact Silicon Carbide Switch For High Voltage Operation
Author
James, C. ; Hettler, C. ; Dickens, J. ; Neuber, A.
Author_Institution
Center for Pulsed Power & Power Electron., Texas Tech Univ., Lubbock, TX
fYear
2008
fDate
27-31 May 2008
Firstpage
17
Lastpage
20
Abstract
Vanadium compensated, 6H silicon carbide (SiC) is investigated as a compact, high-power, linear-mode photoconductive semiconductor switch (PCSS) material. SiC is an attractive material due to its high resistivity, high electrical breakdown strength, and long recombination times compared to other photoconductive materials. The PCSS is designed for fast-rise time, low-jitter (sub-nanosecond) operation in a matched 50 mu test bed. Ohmic contacts were applied by physical vapor deposition and initial test utilized an external Nd:YAG laser trigger source. Analysis of the optical properties of Va-compensated SiC and of switch conduction resistance are presented and performance of contact material is discussed.
Keywords
photoconducting switches; silicon compounds; vanadium; Nd:YAG; SiC; V; YAG laser trigger source; compact silicon carbide switch; contact material; electrical breakdown strength; fast-rise time; high voltage operation; low-jitter operation; ohmic contacts; ohmic test bed; photoconductive materials; photoconductive semiconductor switch; physical vapor deposition; recombination times; switch conduction resistance; Conducting materials; Conductivity; Optical materials; Photoconducting devices; Photoconducting materials; Semiconductor materials; Silicon carbide; Switches; Testing; Voltage; PCSS; Photoconductive switching; SiC; Silicon Carbide;
fLanguage
English
Publisher
ieee
Conference_Titel
IEEE International Power Modulators and High Voltage Conference, Proceedings of the 2008
Conference_Location
Las Vegas, NE
Print_ISBN
978-1-4244-1534-2
Electronic_ISBN
978-1-4244-1535-9
Type
conf
DOI
10.1109/IPMC.2008.4743565
Filename
4743565
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