Title :
Diagnosis of Embedded Software Using Program Spectra
Author :
Zoeteweij, Peter ; Abreu, Rui ; Golsteijn, Rob ; Van Gemund, Arjan J C
Author_Institution :
Embedded Software Lab., Delft Univ. of Technol.
Abstract :
Automated diagnosis of errors detected during software testing can improve the efficiency of the debugging process, and can thus help to make software more reliable. In this paper we discuss the application of a specific automated debugging technique, namely software fault localization through the analysis of program spectra, in the area of embedded software in high-volume consumer electronics products. We discuss why the technique is particularly well suited for this application domain, and through experiments on an industrial test case we demonstrate that it can lead to highly accurate diagnoses of realistic errors
Keywords :
consumer electronics; program debugging; program testing; software reliability; automated debugging; automated diagnosis; embedded software diagnosis; high-volume consumer electronics products; program spectra analysis; software debugging; software fault localization; software reliability; software testing; Application software; Automatic testing; Computer bugs; Consumer electronics; Electronic equipment testing; Embedded software; Embedded system; Software debugging; Software testing; System testing; automated debugging; consumer electronics.; diagnosis; embedded systems; program spectra;
Conference_Titel :
Engineering of Computer-Based Systems, 2007. ECBS '07. 14th Annual IEEE International Conference and Workshops on the
Conference_Location :
Tucson, AZ
Print_ISBN :
0-7695-2772-8
DOI :
10.1109/ECBS.2007.31
