• DocumentCode
    2301314
  • Title

    Oxidation dependence of breakdown strength of XLPE

  • Author

    Gagnon, G. ; Pélissou, S. ; Wertheimer, M.R.

  • Author_Institution
    Hydro-Quebec, Varennes, Que., Canada
  • fYear
    1989
  • fDate
    29 Oct-2 Nov 1989
  • Firstpage
    241
  • Lastpage
    246
  • Abstract
    It has been shown in a previous study (P. Rohl, 1982) that the breakdown strength of polyethylene increases with increasing oxidation levels. The purpose of the research reported here is to verify this somewhat surprising result. Unlike the earlier work, cross-linked polyethylene (XLPE), the principal insulation used in extruded cables, is utilized. The authors correlate dielectric breakdown measurements with oxidation, monitored by Fourier transform infrared (FTIR) spectroscopy, and the results are interpreted using the modified free-volume theory. It is found that the breakdown strength E b indeed shows a slight tendency to increase with the oxidation level. In particular, the authors found a correlation between Eb and the degree of oxidation, expressed in terms of the carbonyl band (1741 cm-1) absorption. The exact reasons for this behavior are not clear at this time, but appear to be compatible with the modified free-volume theory breakdown
  • Keywords
    cable insulation; electric breakdown of solids; electric strength; insulation testing; organic insulating materials; oxidation; polymers; spectrochemical analysis; FTIR spectroscopy; Fourier transform infrared spectroscopy; XLPE; breakdown strength; cable insulation; carbonyl band absorption; cross-linked polyethylene; dielectric breakdown; free-volume theory; oxidation levels; Cable insulation; Cables; Dielectric breakdown; Dielectric measurements; Dielectrics and electrical insulation; Electric breakdown; Infrared spectra; Monitoring; Oxidation; Polyethylene;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1989. Annual Report., Conference on
  • Conference_Location
    Leesburg, VA
  • Type

    conf

  • DOI
    10.1109/CEIDP.1989.69553
  • Filename
    69553