DocumentCode :
2301314
Title :
Oxidation dependence of breakdown strength of XLPE
Author :
Gagnon, G. ; Pélissou, S. ; Wertheimer, M.R.
Author_Institution :
Hydro-Quebec, Varennes, Que., Canada
fYear :
1989
fDate :
29 Oct-2 Nov 1989
Firstpage :
241
Lastpage :
246
Abstract :
It has been shown in a previous study (P. Rohl, 1982) that the breakdown strength of polyethylene increases with increasing oxidation levels. The purpose of the research reported here is to verify this somewhat surprising result. Unlike the earlier work, cross-linked polyethylene (XLPE), the principal insulation used in extruded cables, is utilized. The authors correlate dielectric breakdown measurements with oxidation, monitored by Fourier transform infrared (FTIR) spectroscopy, and the results are interpreted using the modified free-volume theory. It is found that the breakdown strength E b indeed shows a slight tendency to increase with the oxidation level. In particular, the authors found a correlation between Eb and the degree of oxidation, expressed in terms of the carbonyl band (1741 cm-1) absorption. The exact reasons for this behavior are not clear at this time, but appear to be compatible with the modified free-volume theory breakdown
Keywords :
cable insulation; electric breakdown of solids; electric strength; insulation testing; organic insulating materials; oxidation; polymers; spectrochemical analysis; FTIR spectroscopy; Fourier transform infrared spectroscopy; XLPE; breakdown strength; cable insulation; carbonyl band absorption; cross-linked polyethylene; dielectric breakdown; free-volume theory; oxidation levels; Cable insulation; Cables; Dielectric breakdown; Dielectric measurements; Dielectrics and electrical insulation; Electric breakdown; Infrared spectra; Monitoring; Oxidation; Polyethylene;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1989. Annual Report., Conference on
Conference_Location :
Leesburg, VA
Type :
conf
DOI :
10.1109/CEIDP.1989.69553
Filename :
69553
Link To Document :
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