Built-in self test applicability for the non-linear operations of Advanced Encryption Standard

The paper assesses in terms of fault coverage the testing effectiveness of built-in self test for the non-linear operations of the advanced encryption standard (AES). The testing method we propose is particularly attractive due to its reduced hardware implementation overhead and simple error control. The mechanism can be applied both as a concurrent testing solution and as an off-line test. The pseudorandom testing principle described in this article can be easily integrated into an AES design regardless of the particular implementation of the non-linear modules, and requires access only to the unit´s inputs and outputs. The proposed configurations offer full single stuck-at coverage and a fault detection higher than 99.78% for multiple stuck-at faults.