DocumentCode :
2301496
Title :
Complete vector focal field characterization via nanoprobe induced nonlinear far field signals
Author :
Kupka, David ; Bartels, Randy
Author_Institution :
Sch. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO, USA
fYear :
2010
fDate :
7-11 Nov. 2010
Firstpage :
120
Lastpage :
121
Abstract :
An algorithm fully characterizing vector focal plane third order polarization densities and fundamental fields for tightly focused beams through analysis of far field third harmonic intensities is presented.
Keywords :
focal planes; light polarisation; nanophotonics; optical focusing; optical harmonic generation; complete vector focal field characterization; far field third harmonic intensities; tightly focused beams; vector focal plane third order polarization densities;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IEEE Photonics Society, 2010 23rd Annual Meeting of the
Conference_Location :
Denver, CO
ISSN :
-
Print_ISBN :
978-1-4244-5368-9
Electronic_ISBN :
-
Type :
conf
DOI :
10.1109/PHOTONICS.2010.5698787
Filename :
5698787
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2301496
بازگشت