Title :
High performance CMOS array with an embedded test structure
Author :
Pierce, Kerry ; Lipp, Robert ; Chan, Eric ; Wong, Tony
Author_Institution :
CrossCheck Technol. Inc., San Jose, CA, USA
Abstract :
A compacted array containing the CrossCheck embedded test structure has been jointly developed by LSI Logic Corporation and CrossCheck Technology. A test device was built and the embedded test structure was found to successfully collect internal logic node values without disturbing internal logic values. The CrossCheck test structure used a minimum of area in the array and had no observable impact on the test chip logic operating speed
Keywords :
CMOS integrated circuits; application specific integrated circuits; integrated circuit testing; logic arrays; logic testing; ASIC testing; CMOS array; CrossCheck; LSI Logic Corporation; compacted array; embedded test structure; internal logic node values; Application specific integrated circuits; Circuit faults; Circuit testing; Integrated circuit testing; Large scale integration; Logic arrays; Logic devices; Logic testing; Probes; Test pattern generators;
Conference_Titel :
Custom Integrated Circuits Conference, 1990., Proceedings of the IEEE 1990
Conference_Location :
Boston, MA
DOI :
10.1109/CICC.1990.124656
