Title :
SUB-45nm Technology and Design Challenges
Author :
Knoblinger, Gerhard ; Tschanz, James W. ; Pol, Marcal
Author_Institution :
Infineon Technologies
Keywords :
CMOS technology; Circuit synthesis; Design for manufacture; Digital circuits; Electrodes; FETs; Heating; Radio frequency; Semiconductor device modeling; Threshold voltage;
Conference_Titel :
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7695-2795-7
DOI :
10.1109/ISQED.2007.153
