• DocumentCode
    2302123
  • Title

    Multi-Gate MOSFET Design

  • Author

    Knoblinger, Gerhard

  • Author_Institution
    Infineon Technologies
  • fYear
    2007
  • fDate
    39142
  • Firstpage
    3
  • Lastpage
    3
  • Abstract
    Multi-Gate Field Effect Transistors (MuGFET) such as FinFETs and Triple-Gate FETs are the most promising device structures for sub-45nm CMOS technology nodes.The superior control of the channel due to multiple gates reduces short-channel effects and leakage currents.This opens the opportunity for further down scaling of the threshold and supply voltages and device performance improvements. Circuit performance also benefits from novel gate stack materials, reduced parasitic capacitances, and hole mobility improvement.
  • Keywords
    CMOS technology; Circuit synthesis; Design for manufacture; Digital circuits; Electrodes; FETs; Heating; MOSFET circuits; Semiconductor device modeling; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    0-7695-2795-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2007.106
  • Filename
    4148996