DocumentCode
2302123
Title
Multi-Gate MOSFET Design
Author
Knoblinger, Gerhard
Author_Institution
Infineon Technologies
fYear
2007
fDate
39142
Firstpage
3
Lastpage
3
Abstract
Multi-Gate Field Effect Transistors (MuGFET) such as FinFETs and Triple-Gate FETs are the most promising device structures for sub-45nm CMOS technology nodes.The superior control of the channel due to multiple gates reduces short-channel effects and leakage currents.This opens the opportunity for further down scaling of the threshold and supply voltages and device performance improvements. Circuit performance also benefits from novel gate stack materials, reduced parasitic capacitances, and hole mobility improvement.
Keywords
CMOS technology; Circuit synthesis; Design for manufacture; Digital circuits; Electrodes; FETs; Heating; MOSFET circuits; Semiconductor device modeling; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location
San Jose, CA, USA
Print_ISBN
0-7695-2795-7
Type
conf
DOI
10.1109/ISQED.2007.106
Filename
4148996
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