DocumentCode :
2302708
Title :
Study of defect feature dimension reduction based on principal component analysis
Author :
Han Fangfang ; Zhu Junchao ; Zhang Baofeng ; Duan Fajie
Author_Institution :
Tianjin Key Lab. for Control Theor. & Applic. in Complicated Syst., Tianjin Univ. of Technol. Tianjin, Tianjin, China
fYear :
2012
fDate :
29-31 Dec. 2012
Firstpage :
1367
Lastpage :
1371
Abstract :
Feature extraction is an important link of visual defects detection, for it can transform high dimension space of image data into low dimension space of feature. But for the pattern classifier, high dimension input will lead the increasing of identification complexity. Therefore, it is necessary to select one group of features that can most express the defect essential characteristics. Principal component analysis makes use of the thought of statistical variance, which can remove the correlation between the statistical variables and keep all or most of the information. With the example of steel plate surface defects detection, this paper studies the feature dimension reduction based on principal component analysis. Select 7 types steel plate surface defects, acquire 20 sample images from each defect and extract 128 eigenvalues from each sample image. The experiment results show that the principal component analysis can effectively remove the correlation between the feature e data, and keep the necessary information effectively.
Keywords :
eigenvalues and eigenfunctions; feature extraction; image classification; inspection; principal component analysis; production engineering computing; defect feature dimension reduction; eigenvalues; feature extraction; high dimension feature space; identification complexity; image data; low dimension feature space; pattern classification; principal component analysis; statistical variables; statistical variance; steel plate surface defects detection; visual defects detection; Data mining; Defect detection; Feature selection; Principal component analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Science and Network Technology (ICCSNT), 2012 2nd International Conference on
Conference_Location :
Changchun
Print_ISBN :
978-1-4673-2963-7
Type :
conf
DOI :
10.1109/ICCSNT.2012.6526175
Filename :
6526175
Link To Document :
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