Statistical optics of silicon waveguides and microring filters

Measurement of only the average insertion loss and mean propagation delay time of a waveguide constitutes an incomplete picture of light transport, particularly in periodically-patterned structures, in which the increased phase accumulation and delay per unit length compared to conventional waveguides results in greater sensitivity to disorder. Here, we apply a framework of statistical optics to more comprehensively understand experimental measurements of light transport in silicon waveguides and coupled-microring filters.