DocumentCode
2302871
Title
A Genetic Multiple Kernel Relevance Vector Regression Approach
Author
Bing, Wu ; Wen-Qiong, Zhang ; Jia-hong, Liang
Author_Institution
Coll. of Mech. Eng. & Autom., Nat. Univ. of Defense Technol., Changsha, China
Volume
3
fYear
2010
fDate
6-7 March 2010
Firstpage
52
Lastpage
55
Abstract
Relevance vector machine (RVM) is a state-of-the-art technique for regression and classification, as a sparse Bayesian extension version of the support vector machine. The kernel function and parameter selection is a key problem in the research of RVM. The real-world application and recent researches have emphasized the requirement to multiple kernel learning. This paper proposes a novel regression technique, called Genetic Multiple Kernel Relevance Vector Regression (GMK RVR), which combines genetic programming and relevance vector regression to evolve a multiple kernel function. The proposed technique are compared with those of a standard RVR using the Polynomial, Gaussian RBF and Sigmoid kernel with various parameter settings, based on several benchmark problems. Numerical experiments show that the GMK performs better than such widely used kernels and prove the validation of the GMK.
Keywords
Bayes methods; genetic algorithms; learning (artificial intelligence); pattern classification; regression analysis; support vector machines; GMK validation; Gaussian RBF; Sigmoid kernel; benchmark problems; genetic multiple kernel relevance vector regression; genetic programming; kernel function; multiple kernel function; multiple kernel learning; parameter selection; relevance vector machine; sparse Bayesian extension; state-of-the-art technique; support vector machine; Additive noise; Bayesian methods; Computer science education; Educational technology; Genetic programming; Kernel; Machine learning; Optimization methods; Support vector machine classification; Support vector machines; Genetic Multiple Kernel; Relevance vector regression; genetic programming;
fLanguage
English
Publisher
ieee
Conference_Titel
Education Technology and Computer Science (ETCS), 2010 Second International Workshop on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-6388-6
Electronic_ISBN
978-1-4244-6389-3
Type
conf
DOI
10.1109/ETCS.2010.154
Filename
5460012
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