• DocumentCode
    2302958
  • Title

    Paraµ -- A Partial and Higher-Order Mutation Tool with Concurrency Operators

  • Author

    Madiraju, Pratyusha ; Namin, Akbar Siami

  • Author_Institution
    Dept. of Comput. Sci., Texas Tech Univ., Lubbock, TX, USA
  • fYear
    2011
  • fDate
    21-25 March 2011
  • Firstpage
    351
  • Lastpage
    356
  • Abstract
    The mutation operators implemented in a mutation tool typically mutate the entire programs thoroughly and thus generate enormous number of mutants spread all over the programs. However, the complexity and difficulty level of methods implemented in a given program is less evenly distributed all over the program. Hence, the non-uniform distribution of complexity of methods in a program is an indication of testing efforts required for each method. We introduce partial mutations where only the complex parts of the programs are mutated instead of the entire programs. Paraμ is a mutation tool for Java programs enabling partial mutations. In addition to the class mutation, Paraμ implements concurrency mutation operators to address the recent advances in multicore systems and hence mutation testing of parallel and multi-threaded programs. Furthermore, Paraμ allows higher-order mutations by which the users are allowed to specify the order and the types of mutation operators and thus perform a combinatorial higher-order mutation testing.
  • Keywords
    Java; concurrency control; multi-threading; program testing; Java program; Paraμ; class mutation; concurrency mutation operator; higher-order mutation testing; higher-order mutation tool; multicore system; multithreaded program; parallel program; partial mutation; program complexity; program testing; Complexity theory; Concurrent computing; Instruments; Java; Libraries; Software testing; higher-order mutation; mutation testing; object-oriented programs; software testing tools;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Testing, Verification and Validation Workshops (ICSTW), 2011 IEEE Fourth International Conference on
  • Conference_Location
    Berlin
  • Print_ISBN
    978-1-4577-0019-4
  • Electronic_ISBN
    978-0-7695-4345-1
  • Type

    conf

  • DOI
    10.1109/ICSTW.2011.34
  • Filename
    5954433