• DocumentCode
    2302967
  • Title

    Variation Aware Timing Based Placement Using Fuzzy Programming

  • Author

    Mahalingam, V. ; Ranganathan, N.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., South Florida Univ., Tampa, FL
  • fYear
    2007
  • fDate
    26-28 March 2007
  • Firstpage
    327
  • Lastpage
    332
  • Abstract
    In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical timing analysis and variation aware optimization schemes are required to improve the performance and yield of fabricated circuits. In this paper, we propose a new timing based incremental placement algorithm using fuzzy mathematical programming (FMP) in which the uncertainty due to process variations is modeled using fuzzy numbers. The objective is to minimize the worst negative slack of the circuit with the variations in gate and interconnect delays modeled as triangular fuzzy numbers. In this approach, average and worst case deterministic optimizations are performed to determine the bounds of the problem and then, use these bounds to convert the fuzzy problem into a crisp problem. The crisp model is targeted at maximizing the variation resistance or robustness of the circuit without compromising on the achievable performance of the circuit. The proposed approach being tested on ITC ´99 benchmarks shows an average of 12% improvement when compared to the worst case process variations setting, with a timing yield of 99-100%, as verified through Monte-Carlo simulations
  • Keywords
    integrated circuit design; integrated circuit yield; optimisation; statistical analysis; timing; Monte-Carlo simulations; circuit yield; crisp model; delay characteristics; deterministic optimizations; fuzzy mathematical programming; gate delays; incremental placement algorithm; interconnect delays; power characteristics; process variations; statistical timing analysis; triangular fuzzy numbers; variation aware optimization; variation aware timing; Circuit analysis; Delay effects; Integrated circuit interconnections; Mathematical model; Mathematical programming; Nanoscale devices; Performance analysis; Robustness; Timing; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2795-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2007.167
  • Filename
    4149056