• DocumentCode
    2303063
  • Title

    Breeding High-Impact Mutations

  • Author

    Schwarz, Birgit ; Schuler, David ; Zeller, Andreas

  • Author_Institution
    Saarland Univ., Saarbrucken, Germany
  • fYear
    2011
  • fDate
    21-25 March 2011
  • Firstpage
    382
  • Lastpage
    387
  • Abstract
    Mutation testing was developed to measure the adequacy of a test suite by seeding artificial bugs (mutations) into a program, and checking whether the test suite detects them. An undetected mutation either indicates a insufficiency in the test suite and provides means for improvement, or it is an equivalent mutation that cannot be detected because it does not change the program´s semantics. Impact metrics-that quantify the difference between a run of the original and the mutated version of a program-are one way to detectnon-equivalent mutants. In this paper we present a genetic algorithm that aims to produce a set of mutations that have a high impact, are not detected by the test suite, and at the same time are well spread all over the code. We believe that such a set is useful for improving a test suite, as a high impact of a mutation implies it caused a grave damage, which is not detected by the test suite, and that the mutation is likely to be non-equivalent. First results are promising: The number of undetected mutants in a set of evolved mutants increases from 20 to over 70 percent, the average impact of these undetected mutants grows at the same time by a factor of 5.
  • Keywords
    genetic algorithms; program debugging; program testing; artificial bugs; equivalent mutation; genetic algorithm; high-impact mutations; mutation testing; Genetic algorithms; Genetic mutations; Materials; Next generation networking; Semantics; Testing; genetic algorithm; mutation testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Testing, Verification and Validation Workshops (ICSTW), 2011 IEEE Fourth International Conference on
  • Conference_Location
    Berlin
  • Print_ISBN
    978-1-4577-0019-4
  • Electronic_ISBN
    978-0-7695-4345-1
  • Type

    conf

  • DOI
    10.1109/ICSTW.2011.56
  • Filename
    5954437