Title :
A High Frequency PWM Controller in HV Bi-CMOS Process Considering SOI Self-Heating
Author :
Singh, Gautam Kumar ; Panierahi, S.K.
Author_Institution :
Pulsecore Semicond. Pvt. Ltd., Bangalore
Abstract :
A companion analysis of self-heating effect (SHE) in HV-BiCMOS SOI degradation of circuit performance and impact on long term reliability because of SHE is presented. Band-gap voltage and output impedance degradation due to SOI self-heating are discussed. Also an efficient scheme for designing long term reliable pulse width modulation (PWM) controller has been discussed along with silicon and reliability test results
Keywords :
BiCMOS integrated circuits; PWM power convertors; heating; integrated circuit reliability; power integrated circuits; silicon-on-insulator; BiCMOS process; output impedance degradation; pulse width modulation controller; self-heating effect; silicon-in-insulator; Circuit optimization; Degradation; Frequency; Impedance; Performance analysis; Photonic band gap; Pulse width modulation; Silicon; Space vector pulse width modulation; Voltage;
Conference_Titel :
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2795-7
DOI :
10.1109/ISQED.2007.13
