DocumentCode
2303147
Title
A landmark-based approach of shape dissimilarity
Author
van-der-Heijden, G.W.A.M. ; Vossepoel, A.M.
Author_Institution
DLO-Centre for Plant Breeding & Reproduction Res., Wageningen, Netherlands
Volume
1
fYear
1996
fDate
25-29 Aug 1996
Firstpage
120
Abstract
A general contour-oriented shape dissimilarity measure is shown to give unreliable answers due to the arc-length parametrization. Local differences in curve-length due to biological variation cause mismatches in the contour-representations. In many applications all objects to be compared have a basic model in common, which can often be found by the use of landmarks. In the application shown here, which was a comparison of flowers of potato-species (Solanum spp), the basic model was characterized by the five petal tips, which should be at equal intervals. By restoring the basic model for each contour before calculating the dissimilarity measures, the errors of the arc-length parametrization were considerably reduced. This resulted in more reliable and faster dissimilarity measures for the application of potato flowers
Keywords
image restoration; object recognition; arc-length parametrization; biological variation; contour-oriented shape dissimilarity measure; landmark-based approach; petal tips; Biological system modeling; Shape measurement; Skeleton; Solids;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 1996., Proceedings of the 13th International Conference on
Conference_Location
Vienna
ISSN
1051-4651
Print_ISBN
0-8186-7282-X
Type
conf
DOI
10.1109/ICPR.1996.546003
Filename
546003
Link To Document