• DocumentCode
    2303147
  • Title

    A landmark-based approach of shape dissimilarity

  • Author

    van-der-Heijden, G.W.A.M. ; Vossepoel, A.M.

  • Author_Institution
    DLO-Centre for Plant Breeding & Reproduction Res., Wageningen, Netherlands
  • Volume
    1
  • fYear
    1996
  • fDate
    25-29 Aug 1996
  • Firstpage
    120
  • Abstract
    A general contour-oriented shape dissimilarity measure is shown to give unreliable answers due to the arc-length parametrization. Local differences in curve-length due to biological variation cause mismatches in the contour-representations. In many applications all objects to be compared have a basic model in common, which can often be found by the use of landmarks. In the application shown here, which was a comparison of flowers of potato-species (Solanum spp), the basic model was characterized by the five petal tips, which should be at equal intervals. By restoring the basic model for each contour before calculating the dissimilarity measures, the errors of the arc-length parametrization were considerably reduced. This resulted in more reliable and faster dissimilarity measures for the application of potato flowers
  • Keywords
    image restoration; object recognition; arc-length parametrization; biological variation; contour-oriented shape dissimilarity measure; landmark-based approach; petal tips; Biological system modeling; Shape measurement; Skeleton; Solids;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 1996., Proceedings of the 13th International Conference on
  • Conference_Location
    Vienna
  • ISSN
    1051-4651
  • Print_ISBN
    0-8186-7282-X
  • Type

    conf

  • DOI
    10.1109/ICPR.1996.546003
  • Filename
    546003