Title :
Particle-in-cell simulation of beam-electron cloud interactions
Author_Institution :
KEK, Ibaraki, Japan
Abstract :
We study single bunch effects caused by an electron cloud using a simulation based on the particle-in-cell (PIC) method. The PIC method has been used for a strong-strong simulation of beam-beam effects. We apply the method to the electron cloud issues. A head-tail effect has been discussed using analysis based on coherent modes, if anything. We can treat both of coherent and incoherent effects fairly in the PIC model. We study which or how phenomenon is important in the beam-electron cloud interactions
Keywords :
particle beam bunching; beam-beam effects; beam-electron cloud interactions; coherent modes; head-tail effect; incoherent effects; particle-in-cell simulation; single bunch effects; strong-strong simulation; Clouds; Ear; Electron beams; Green function; Lattices; Lenses; Magnetic fields; Particle beams; Resonance; Synchrotrons;
Conference_Titel :
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-7191-7
DOI :
10.1109/PAC.2001.987219
