• DocumentCode
    2303307
  • Title

    High Voltage Square Wave Generator for Motor Coil Insulation Testing

  • Author

    Yu, Ya Tong ; Jayaram, Shesha H.

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Waterloo, Waterloo, ON
  • fYear
    2008
  • fDate
    27-31 May 2008
  • Firstpage
    436
  • Lastpage
    438
  • Abstract
    Applications of solid state driver for medium or high voltage motor are widespread. However, due to high switching frequency as well as high dV/dt, increased dielectric stresses and thermal stresses are applied on the insulation system; thus leading to the insulation failure of the motor. In order to test the insulation performance of the motor under the above stress conditions, a motor insulation testing facility which can generate high voltage and high frequency square waveform is developed. In the paper, low voltage solid state switches are used to generate high voltage square wave. The generator consists of several cascaded stages and each stage is made of IGBT stacks, capacitor, and wave shaping resistors. With specially designed charging and discharging circuits, each stage can generate square wave independently. Several stages can be cascaded to generate higher output voltage; the rise time can be as short as 200 ns, and the pulse width can be up to several milliseconds. Cascade connection methods are discussed and experimental results are presented in the paper. It has been shown that the cascade connection can make it possible to generate high voltage output by using low voltage solid state switches without any problem related to voltage division and synchronism of the cascaded stages.
  • Keywords
    coils; electric motors; insulation testing; power semiconductor switches; square-wave generators; IGBT stack; cascade connection method; charging-discharging circuit; high voltage square wave generator; low voltage solid state switch; motor coil insulation testing; wave shaping resistor; Coils; Dielectrics and electrical insulation; Insulated gate bipolar transistors; Insulation testing; Low voltage; Medium voltage; Solid state circuits; Switches; Switching frequency; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE International Power Modulators and High Voltage Conference, Proceedings of the 2008
  • Conference_Location
    Las Vegas, NE
  • Print_ISBN
    978-1-4244-1534-2
  • Electronic_ISBN
    978-1-4244-1535-9
  • Type

    conf

  • DOI
    10.1109/IPMC.2008.4743683
  • Filename
    4743683