DocumentCode :
2303313
Title :
Impact of Variability on Clock Skew in H-tree Clock Networks
Author :
Narasimhan, Ashok ; Sridhar, Ramalingam
Author_Institution :
Dept. of Comput. Sci. & Eng., Buffalo Univ., NY
fYear :
2007
fDate :
26-28 March 2007
Firstpage :
458
Lastpage :
466
Abstract :
Clock distribution networks play a key role in determining overall system performance. In this paper, the authors investigate the effect of parameter variations on the performance of a commonly used clock distribution structure, a H-tree clock network. The design of robust high performance clock networks face significant challenges due to increasing parameter variations in sub-65nm technologies. As shown in the results, the contribution of interconnect variations to clock skew has risen by upto 3 times from 180nm to 45nm technology. It also suggests that the effect of variability is most prominent at the second and third stages of the 5-stage H-tree clock network. This analysis will help develop mitigation techniques that focus on addressing specific failure mechanisms caused by variability in clock networks
Keywords :
clocks; integrated circuit design; integrated circuit interconnections; nanoelectronics; 45 to 180 nm; H-tree clock networks; clock distribution networks; clock skew; interconnect variations; Circuits; Clocks; Computer science; Design for manufacture; Error correction codes; Failure analysis; Manufacturing processes; Robustness; Semiconductor device manufacture; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2795-7
Type :
conf
DOI :
10.1109/ISQED.2007.88
Filename :
4149078
Link To Document :
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