Evolutionary based techniques for fault tolerant field programmable gate arrays

The use of SRAM-based field programmable gate arrays (FPGAs) is becoming more and more prevalent in space applications. Commercial-grade FPGAs are potentially susceptible to permanently debilitating single-event latchups (SELs). Repair methods based on evolutionary algorithms may be applied to FPGA circuits to enable successful fault recovery. This paper presents the experimental results of applying such methods to repair four commonly used circuits (quadrature decoder, 3-by-3-bit multiplier, 3-by-3-bit adder, 4-to-7 decoder) into which a number of simulated faults has been introduced. The results suggest that evolutionary repair techniques can improve the process of fault recovery when used instead of, or as a supplement to triple modular redundancy (TMR), which is currently the predominant method for mitigating FPGA faults