Title :
Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications
Author :
Laknaur, Amit ; Xiao, Rui ; Durbha, Sai ; Wang, Haibo
Author_Institution :
Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL
Abstract :
This paper presents a novel window comparator circuit whose error threshold can be adaptively adjusted according to its input signal levels. It is ideal for analog online testing applications. Advantages of adaptive comparator error thresholds over constant or relative error thresholds in analog testing applications are discussed. Analytical equations for guiding the design of proposed comparator circuitry are derived. The proposed comparator circuit has been designed and fabricated using a CMOS 0.18mu technology. Measurement results of the fabricated chip are presented
Keywords :
CMOS analogue integrated circuits; comparators (circuits); integrated circuit testing; 0.18 micron; CMOS integrated circuit; adaptive error threshold; analog online testing; analytical equations; window comparator circuit; Adaptive filters; Application software; CMOS technology; Circuit faults; Circuit testing; Computer errors; Electrical fault detection; Electronic equipment testing; Switches; System testing;
Conference_Titel :
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2795-7
DOI :
10.1109/ISQED.2007.57
