Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications

Author

Laknaur, Amit ; Xiao, Rui ; Durbha, Sai ; Wang, Haibo

Author_Institution

Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL

fYear

2007

fDate

26-28 March 2007

Firstpage

501

Lastpage

506

Abstract

This paper presents a novel window comparator circuit whose error threshold can be adaptively adjusted according to its input signal levels. It is ideal for analog online testing applications. Advantages of adaptive comparator error thresholds over constant or relative error thresholds in analog testing applications are discussed. Analytical equations for guiding the design of proposed comparator circuitry are derived. The proposed comparator circuit has been designed and fabricated using a CMOS 0.18mu technology. Measurement results of the fabricated chip are presented

Keywords

CMOS analogue integrated circuits; comparators (circuits); integrated circuit testing; 0.18 micron; CMOS integrated circuit; adaptive error threshold; analog online testing; analytical equations; window comparator circuit; Adaptive filters; Application software; CMOS technology; Circuit faults; Circuit testing; Computer errors; Electrical fault detection; Electronic equipment testing; Switches; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on

Conference_Location

San Jose, CA

Print_ISBN

0-7695-2795-7

Type

conf

DOI

10.1109/ISQED.2007.57

Filename

4149084