• DocumentCode
    2303397
  • Title

    Dependence of the Delay Time on the Mean Electron Seed Kinetic Energy in a Pseudospark Discharge

  • Author

    Leathem, S.O. ; Stoltz, P.

  • Author_Institution
    Tech-X Corp., Boulder, CO
  • fYear
    2008
  • fDate
    27-31 May 2008
  • Firstpage
    455
  • Lastpage
    456
  • Abstract
    The time taken to reach the breakdown phase in a psuedospark discharge is shown to depend upon the mean kinetic energy of the seed electrons. The electrons are injected at the axis on the hollow cavity back wall and the initial electric field across the anode-cathode gap is insufficient to permit or enhance electronimpact ionization throughout most of the hollow cathode backspace. The investigation is performed using the two-dimensional kinetic particle-in-cell code, OOPIC Pro. It is shown that the delay time is dependent upon the energy range of the seed electrons, where two categories are distinguished; (1) mid-energy, where the ionization cross-section decreases after each collision energy loss, and (2) high-energy, where the injection speeds ensure that, in contrast, the cross-section increases after energy losses as the electrons travel downstream to the cathode exit. In the latter case, linear dependencies on the kinetic energy of the seed electrons are demonstrated making it possible to estimate the neutral gas pressure that will minimize the delay time for a given geometrical configuration and mean seed injection speed.
  • Keywords
    discharges (electric); 2D kinetic particle-in-cell code; OOPIC Pro; anode-cathode gap; collision energy loss; delay time; enhance electronimpact ionization; mean electron seed kinetic energy; psuedospark discharge; seed electrons; Anodes; Cathodes; Delay effects; Delay estimation; Electric breakdown; Electrons; Energy loss; Ionization; Kinetic energy; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE International Power Modulators and High Voltage Conference, Proceedings of the 2008
  • Conference_Location
    Las Vegas, NE
  • Print_ISBN
    978-1-4244-1534-2
  • Electronic_ISBN
    978-1-4244-1535-9
  • Type

    conf

  • DOI
    10.1109/IPMC.2008.4743688
  • Filename
    4743688