• DocumentCode
    2303572
  • Title

    Opening Switch Utilizing Stress Induced Conduction in Polymethylmethacrylate

  • Author

    Lynn, C. ; Krile, J. ; Neuber, A. ; Dickens, J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Tech Univ., Lubbock, TX
  • fYear
    2008
  • fDate
    27-31 May 2008
  • Firstpage
    483
  • Lastpage
    486
  • Abstract
    It is known that polymethylmethacrylate, PMMA, becomes conductive under shock loading. To develop an opening switch utilizing shock induced conduction, the reversibility of this process must be studied. It is suggested in literature that changes in electrical properties begin at pressures as low a ~2 GPa. Applying the minimum pressure necessary for conduction is desirable in order to maximize the reversibility by limiting compression heating of the material. CTH, a hydrodynamic code written at Sandia National Laboratory, was used to design various drivers that deliver pressures in the range of ~2 GPa to ~6 GPa to the PMMA. By utilizing the switch to trigger an RC discharge, the resistance and on-time of the switch was characterized. Experiments have shown conduction durations on the order of ~4 mus. The switch was then placed into a capacitive driven inductive energy storage circuit, IES, to determine the polymer´s ability to recover. This paper will present experimental data, CTH simulation results, and discuss the attained switching characteristics under varying shock pressure profiles.
  • Keywords
    discharges (electric); energy storage; stress analysis; switching circuits; PMMA; Sandia National Laboratory; electrical properties; hydrodynamic codes; inductive energy storage circuit; polymethylmethacrylate; shock induced conduction; shock loading; stress induced conduction; switching characteristics; Conducting materials; Electric shock; Energy storage; Heating; Hydrodynamics; Laboratories; Polymers; Stress; Switches; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE International Power Modulators and High Voltage Conference, Proceedings of the 2008
  • Conference_Location
    Las Vegas, NE
  • Print_ISBN
    978-1-4244-1534-2
  • Electronic_ISBN
    978-1-4244-1535-9
  • Type

    conf

  • DOI
    10.1109/IPMC.2008.4743696
  • Filename
    4743696