• DocumentCode
    2303680
  • Title

    Statistical and Formative Delay Times for Sub-Nanosecond Breakdown at Sub-Atmospheric Pressure

  • Author

    Chaparro, Jordan ; Hatfield, Lynn ; Krompholz, Hermann ; Neuber, Andreas

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Tech Univ., Lubbock, TX
  • fYear
    2008
  • fDate
    27-31 May 2008
  • Firstpage
    503
  • Lastpage
    506
  • Abstract
    For subnanosecond switching, physical phenomena as well as basic breakdown data, such as delay times and breakdown voltages, are of interest. With a RADAN Pulser as source for voltage pulses with up to 180 kV amplitude and risetimes at a test gap of 180 ps, we investigate statistical and formative delays for argon and dry air at sub-atmospheric pressure, for gap widths of 1 and 11 mm. Formative times have minima between 50 and 200 torr, and range from 70 ps at 1.5 MV/cm to 200 ps at 50 kV/cm. For this range of electric fields, this dependence on pressure and applied field can be explained by the behavior of ionization coefficient and electron drift velocity for homogeneous discharges. For higher fields exhibiting a narrow ionization zone in cathode vicinity with pronounced electron runaway conditions, the experimental data agree with results of Monte-Carlo simulations. Statistical delays are about the same as formative delays at fields of 50 kV/cm, and are reduced with increasing field amplitude to less than 50 ps at 1.5 MV/cm. It appears that field emission is the major source for starting electrons, influencing the statistical delay time near the field emission threshold only.
  • Keywords
    Monte Carlo methods; delays; electric fields; nanotechnology; pulsed power switches; Monte-Carlo simulations; RADAN pulser; delay times; electric fields; electron drift velocity; pressure 50 torr to 200 torr; statistical delays; sub-atmospheric pressure; sub-nanosecond breakdown; time 180 ps; Argon; Breakdown voltage; Cathodes; Delay; Electric breakdown; Electron emission; Electron mobility; Ionization; Space vector pulse width modulation; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE International Power Modulators and High Voltage Conference, Proceedings of the 2008
  • Conference_Location
    Las Vegas, NE
  • Print_ISBN
    978-1-4244-1534-2
  • Electronic_ISBN
    978-1-4244-1535-9
  • Type

    conf

  • DOI
    10.1109/IPMC.2008.4743701
  • Filename
    4743701