• DocumentCode
    2304250
  • Title

    Measuring the linewidth enhancement factor of optoelectronics devices based on a Mach-Zehnder interferometer

  • Author

    Provost, Jean-Guy ; Grillot, Frédéric

  • Author_Institution
    III-V Lab., Alcatel-Thales, Marcoussis, France
  • fYear
    2010
  • fDate
    7-11 Nov. 2010
  • Firstpage
    425
  • Lastpage
    426
  • Abstract
    A technique based on a Mach-Zehnder interferometer is proposed in order to evaluate dynamical properties of optoelectronic devices. In particular this experimental setup allows extracting the value and the sign of the linewidth enhancement factor.
  • Keywords
    Mach-Zehnder interferometers; distributed feedback lasers; optoelectronic devices; quantum well lasers; Mach-Zehnder interferometer; linewidth enhancement factor; optoelectronics devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE Photonics Society, 2010 23rd Annual Meeting of the
  • Conference_Location
    Denver, CO
  • ISSN
    -
  • Print_ISBN
    978-1-4244-5368-9
  • Electronic_ISBN
    -
  • Type

    conf

  • DOI
    10.1109/PHOTONICS.2010.5698941
  • Filename
    5698941
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2304250