DocumentCode :
2304297
Title :
Bismuth-filled anisotropically conductive adhesive for flip chip bonding
Author :
Vuorela, M. ; Holloway, M. ; Fuchs, S. ; Stam, F. ; Kivilahti, J.
Author_Institution :
Lab. of Electron. Prod. Technol., Helsinki Univ. of Technol., Espoo, Finland
fYear :
2000
fDate :
2000
Firstpage :
147
Lastpage :
152
Abstract :
In this communication a new bismuth (Bi)-filled anisotropically conductive adhesive (ACA), which can be used to bond pure tin (Sn) or any Sn-based contact areas, is presented. In this study the adhesive was used to join tin-lead (SnPb) -bumped test chips to SnPb-coated contact pads on FR4-substrate. Due to the metallurgical characteristics of the SnPbBi system, the process temperature and bonding pressure remain low. With the help of pure Bi particles, the SnPb bumps are fused with the SnPb-coated contact pads above 92°C forming small local solder joints, while the adhesive acts as an underfill. The microscopic solder interconnections retain their electrically continuity even though the adhesive matrix relaxes in service. Good quality metallurgical interconnections were produced by the bonding procedure with relatively low bonding temperature (160°C) and pressure (24.5 g/bump). No intermetallics are formed in this bonding system. The Bi-filled ACA exhibits good reliability under high temperature and high humidity conditions (85°C/85%RH). Thermal shock test (-40°C/+125°C, total cycle time 1 hour) showed that good reliability can be achieved even though the bonding process is not yet optimized. The failure of the joints is due to the formation of small liquid phases in the Bi-rich (over 10 at-%) areas in the solid lentils at the upper thermal shock temperature. This can be avoided by using higher bonding temperature. The discrepancy of reliability results is explained by the fact that the temperature of bonding has not been exactly the same for all the samples bonded
Keywords :
adhesives; conducting polymers; encapsulation; filled polymers; flip-chip devices; integrated circuit interconnections; integrated circuit reliability; integrated circuit testing; lead bonding; production testing; -40 to 125 degC; 160 degC; Bi; FR4-substrate; adhesive matrix; anisotropically conductive adhesive; bonding pressure; bonding procedure; bonding temperature; bumped test chips; flip chip bonding; humidity; local solder joints; metallurgical characteristics; metallurgical interconnections; microscopic solder interconnections; process temperature; reliability; thermal shock test; underfill; Anisotropic magnetoresistance; Bismuth; Bonding; Conductive adhesives; Contacts; Electric shock; Flip chip; Temperature; Testing; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Adhesive Joining and Coating Technology in Electronics Manufacturing, 2000. Proceedings. 4th International Conference on
Conference_Location :
Espoo
Print_ISBN :
0-7803-6460-0
Type :
conf
DOI :
10.1109/ADHES.2000.860589
Filename :
860589
Link To Document :
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