• DocumentCode
    2304340
  • Title

    Power-Gating Aware Floorplanning

  • Author

    Hailin Jiang ; Marek-Sadowska, M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA
  • fYear
    2007
  • fDate
    26-28 March 2007
  • Firstpage
    853
  • Lastpage
    860
  • Abstract
    Power-gating is a technique for efficiently reducing leakage power by shutting off the idle blocks. However, the presence of power-gating may also introduce negative effects, which are not considered in the earlier design stages. Ignoring those effects may result in suboptimal designs and potentially even nullify the intended power savings. In this paper, the authors propose a novel measure to efficiently capture the power-gating effects. The authors apply this measure in a floorplanner for power-gated chips. Experimental results show that the power-gating aware floorplanner can achieve 50% decap saving compared to a floorplanner unaware of power gating. Leakage power can be saved by inserting less decap, especially when thin-oxide decap are used due to the area constraint. The approach can reduce leakage power consumed by decap from 36mW to 9mW when area overhead is limited to about 19% of the total chip area
  • Keywords
    integrated circuit layout; leakage currents; leakage power; power-gated chips; power-gating aware floorplanning; thin-oxide decap; CMOS logic circuits; CMOS process; Network-on-a-chip; Power supplies; Power system reliability; Semiconductor device measurement; Sleep; Switches; Threshold voltage; Voltage fluctuations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2795-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2007.123
  • Filename
    4149140