Title :
Ultralow-voltage design and technology of silicon-on-thin-buried-oxide (SOTB) CMOS for highly energy efficient electronics in IoT era
Author :
Kamohara, Shiro ; Sugii, Nobuyuki ; Yamamoto, Yusaku ; Makiyama, Hideki ; Yamashita, Takayoshi ; Hasegawa, T. ; Okanishi, Shinobu ; Yanagita, Hiroshi ; Kadoshima, Masaru ; Maekawa, Keiichi ; Mitani, Hitoshi ; Yamagata, Yoshiki ; Oda, Hidekazu ; Yamaguchi,
Author_Institution :
Low-Power Electron. Assoc. & Project, Tsukuba, Japan
Abstract :
Ultralow-voltage (ULV) operation of CMOS circuits is effective for significantly reducing the power consumption of the circuits. Although operation at the minimum energy point (MEP) is effective, its slow operating speed has been an obstacle. The silicon-on-thin-buried-oxide (SOTB) CMOS is a strong candidate for ultralow-power (ULP) electronics because of its small variability and back-bias control. These advantages of SOTB CMOS enable power and performance optimization with adaptive Vth control at ULV and can achieve ULP operation with acceptably high speed and low leakage. In this paper, we describe our recent results on the ULV operation of the CPU, SRAM, ring oscillator, and, other logic circuits. Our 32-bit RISC CPU chip, named “Perpetuum Mobile,” has a record low energy consumption of 13.4 pJ when operating at 0.35 V and 14 MHz. Perpetuum-Mobile micro-controllers are expected to be a core building block in a huge number of electronic devices in the internet-of-things (IoT) era.
Keywords :
CMOS integrated circuits; Internet of Things; SRAM chips; low-power electronics; microcontrollers; CMOS circuits; Internet-of-Things era; IoT era; MEP; Perpetuum-mobile micro-controllers; RISC CPU chip; SOTB CMOS; SRAM; ULP electronics; electronic devices; energy 13.4 pJ; energy efficient electronics; frequency 14 MHz; logic circuits; low energy consumption; minimum energy point; power consumption; ring oscillator; silicon-on-thin-buried-oxide; storage capacity 32 bit; ultralow-power electronics; ultralow-voltage design; voltage 0.35 V; CMOS integrated circuits; Delays; Logic gates; Mobile communication; Random access memory; Silicides; Transistors;
Conference_Titel :
VLSI Technology (VLSI-Technology): Digest of Technical Papers, 2014 Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4799-3331-0
DOI :
10.1109/VLSIT.2014.6894413