DocumentCode
2304867
Title
Determining the similarity of point patterns using internal, nonmetric representations: preliminary results
Author
Kreifeldt, John G. ; Levine, Stephen H. ; Nah, Keoun ; Liu, Lin
Author_Institution
Dept. of Mech. Eng., Tufts Univ., Medford, MA, USA
Volume
5
fYear
1998
fDate
11-14 Oct 1998
Firstpage
4492
Abstract
Point patterns can be represented by rank ordered lists of interpoint distances. This use of ordinal (i.e. nonmetric) information, combined with the independence of the representation from any coordinate system, means that the resulting representation, and reconstruction as well, is indifferent to scale, translation, rotation, and reflection. This paper focuses on establishing a measure of similarity between non-identical patterns of P points. In doing so, it considers two cases. The first, and simpler, includes an a priori specification of the point correspondences between the two patterns; in the second no such a priori specification is made and it thus requires first determining the best assignment of point correspondences
Keywords
image reconstruction; image representation; pattern recognition; interpoint distances; point correspondences; point patterns; rank ordered lists; reconstruction; representation; Educational institutions; Mean square error methods; Mechanical engineering; Multidimensional systems; Reflection; Stress measurement; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man, and Cybernetics, 1998. 1998 IEEE International Conference on
Conference_Location
San Diego, CA
ISSN
1062-922X
Print_ISBN
0-7803-4778-1
Type
conf
DOI
10.1109/ICSMC.1998.727558
Filename
727558
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