Title :
Macro-femto inter-cell interference mitigation for 3GPP LTE-A downlink
Author :
Huang, Ming ; Xu, Wen
Author_Institution :
Tech. Univ. Munchen, Mϋnchen, Germany
Abstract :
In LTE-A or Rel. 10+, heterogeneous network deployments are supported to improve the user experienced link performance. However, such deployments give rise to new interference problems. In this study, macro-femto-cell interference scenarios for LTE-A downlink are investigated. We focus on the critical interference scenario of colliding cell-specific reference signals (CRSs). As conventional receivers with channel estimation based on the interfered CRSs fail to work properly, we present advanced interference mitigation schemes for user equipment (UE), such as the received-power dependent interference cancellation (IC), decision-directed channel estimation and IC-assisted channel estimation. Numerical simulation results showed that the proposed schemes are able to significantly reduce the inter-cell interference so that high throughput can be ensured even under the harsh macro-femto interferences.
Keywords :
3G mobile communication; Long Term Evolution; channel estimation; femtocellular radio; interference suppression; numerical analysis; radiofrequency interference; 3GPP LTE-A downlink; CRS; IC-assisted channel estimation; cell-specific reference signal colliding; critical interference scenario; decision-directed channel estimation; heterogeneous network deployments; interference problems; macrofemto intercell interference mitigation; numerical simulation; received-power dependent interference cancellation; receivers; user equipment; user experienced link performance; Bit error rate; Channel estimation; Integrated circuits; Interference; Receivers; Signal to noise ratio; Throughput; LTE-A/LTE-advanced; MMSE; decision-directed channel estimation; enhanced inter-cell interference coordination (eICIC); interference cancellation (IC); joint detection;
Conference_Titel :
Wireless Communications and Networking Conference Workshops (WCNCW), 2012 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4673-0681-2
DOI :
10.1109/WCNCW.2012.6215544