DocumentCode :
2305280
Title :
Site-controlled, high density InAs quantum dots by nanoscale selective area epitaxy
Author :
Dias, N.L. ; Garg, A. ; Young, J.D. ; Reddy, U. ; Coleman, J.J.
Author_Institution :
Univ. of Illinois, Urbana, IL, USA
fYear :
2010
fDate :
7-11 Nov. 2010
Firstpage :
528
Lastpage :
529
Abstract :
High density, ordered arrays of InAs quantum dots by electron beam lithography and selective area epitaxy emitting in the 1.1μm range are demonstrated. The role of mask geometry on quantum dot nucleation is determined.
Keywords :
MOCVD; electron beam lithography; indium compounds; nucleation; semiconductor quantum dots; InAs; electron beam lithography; mask geometry; nanoscale selective area epitaxy; quantum dot nucleation; site-controlled high density quantum dots;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IEEE Photonics Society, 2010 23rd Annual Meeting of the
Conference_Location :
Denver, CO
ISSN :
-
Print_ISBN :
978-1-4244-5368-9
Electronic_ISBN :
-
Type :
conf
DOI :
10.1109/PHOTONICS.2010.5698994
Filename :
5698994
Link To Document :
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