Title :
Quasi static analysis of hybrid and monolithic integrated circuits interconnections
Author :
Affane, H. ; Bourdoucen, H
Author_Institution :
Nat. Inst. of Electr. & Electron., Boumerdes, Algeria
Abstract :
Integrated-circuit interconnections are analyzed in quasi-static mode using the method of lines. The coupling capacitances are determined for monolithic and hybrid structures having parallel multiconductors at two different dielectric layer interfaces. The anisotropy effects on the coupling between crossing conductors are investigated for different dimensions of strip width and substrate thickness. The anisotropy effect on the couplings increases with wider strips and thinner substrates. The coupling capacitances are also investigated for parallel conductors on an isotropic substrate. For parallel coplanar conductors the couplings increase with closer strips and thicker substrates, while for conductors on different interfaces the coupling capacitance increases for wider strips and thinner substrates. The number of strips affects the couplings for thicker dielectric substrates
Keywords :
MMIC; capacitance; hybrid integrated circuits; integrated circuit interconnections; microwave integrated circuits; transmission line matrix methods; anisotropy effects; coupling capacitances; crossing conductor coupling; dielectric layer interfaces; dielectric substrates; hybrid integrated circuit interconnections; method of lines; microwave integrated circuits; monolithic integrated circuit interconnections; parallel coplanar conductors; parallel multiconductors; quasi-static mode; quasistatic analysis; Anisotropic magnetoresistance; Capacitance; Conductors; Coupling circuits; Dielectric substrates; Electric potential; Integrated circuit interconnections; Monolithic integrated circuits; Strips; Symmetric matrices;
Conference_Titel :
Electronic Components and Technology Conference, 1993. Proceedings., 43rd
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0794-1
DOI :
10.1109/ECTC.1993.346705
