• DocumentCode
    230561
  • Title

    Nanooptics and electrons: From strong-field physics at needle tips to dielectric laser acceleration

  • Author

    Kruger, Max ; Thomas, Stephan ; Breuer, Johannes ; Forster, Michael ; Ehberger, Dominik ; Hammer, Jacob ; Higuchi, Tatsuro ; Aghajani-Talesh, Anoush ; McNeur, Josh ; Weber, Piotr ; Hommelhoff, Peter

  • Author_Institution
    Dept. of Phys., Friedrich-Alexander-Univ. Erlangen-Nurnberg, Nürnberg, Germany
  • fYear
    2014
  • fDate
    6-10 July 2014
  • Firstpage
    3
  • Lastpage
    4
  • Abstract
    We will report on control of electrons near nanoscale structures. In the first part of the talk, we will present results on strong-field physics in the near-field of a nanometer sharp needle tip. In particular, we will focus on field enhancement measurements with the laser-emitted electrons, and simulations thereof. In the second part we will show that charged particles can be efficiently and continuously accelerated with the optical carrier field of laser pulses provided that dielectric structures are employed to shape the phase front of the laser pulse. We show an experimental demonstration of dielectric laser acceleration of non-relativistic 30-keV electrons with a peak acceleration gradient of 25MeV/m, already on par with nowadays RF accelerators. With relativistic electrons, the acceleration gradient should exceed 1 GeV/m.
  • Keywords
    field emission; nanophotonics; relativistic electron beams; dielectric laser acceleration; dielectric structures; electron volt energy 30 keV; field enhancement measurements; laser pulses; laser-emitted electrons; nanometer sharp needle tip; nanooptics; nanoscale structures; optical carrier field; peak acceleration gradient; relativistic electrons; strong-field physics; Acceleration; Dielectrics; Electron optics; Free electron lasers; Laser theory; Measurement by laser beam;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2014 27th International
  • Conference_Location
    Engelberg
  • Print_ISBN
    978-1-4799-5306-6
  • Type

    conf

  • DOI
    10.1109/IVNC.2014.6894731
  • Filename
    6894731