DocumentCode
2305672
Title
High density integrated circuit design: simultaneous switching ground/power noises calculation for pin grid array packages
Author
Bedouani, M.
Author_Institution
Bull Res. Center, Les Clayes sous Bois, France
fYear
1993
fDate
1-4 Jun 1993
Firstpage
1039
Lastpage
1044
Abstract
The author presents basic electrical models to calculate equivalent inductances (noises) for a 179 pin grid array package as a function of ground/power/signals pin organizations. A full experimental inductances measurement based on time domain reflectometry and frequency method is also presented. A specific test vehicle was elaborated to avoid fixturing noise. Calculated and measured signal effective inductance values are compared. Each integrated circuit logic family has a specific switching point. Thus, adequate ground/power/signal organization depends on the technology used. For some logic families like TTL (transistor transistor logic) and DCFL in silicon and GaAs technologies, the switching point near the ground voltage indicates that the critical path is ground. On other hand, the internal switching current becomes comparable to the input buffers (30-50 mA/ns). Thus, the ground/signal/power organization of output buffers must take into account the internal logic I/O´s (input/outputs). The noises are as function of the number of IO buffers and internal logic IO gates
Keywords
CMOS integrated circuits; equivalent circuits; inductance measurement; integrated circuit technology; integrated circuit testing; integrated logic circuits; noise; packaging; time-domain reflectometry; CMOS ICs; PGA package design; electrical models; high density integrated circuit design; inductances measurement; integrated circuit logic family; pin grid array packages; simultaneous switching ground/power noises calculation; time domain reflectometry; Electronics packaging; Frequency measurement; Integrated circuit measurements; Integrated circuit noise; Integrated circuit packaging; Integrated circuit synthesis; Integrated circuit technology; Logic; Switching circuits; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1993. Proceedings., 43rd
Conference_Location
Orlando, FL
Print_ISBN
0-7803-0794-1
Type
conf
DOI
10.1109/ECTC.1993.346724
Filename
346724
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