• DocumentCode
    2305672
  • Title

    High density integrated circuit design: simultaneous switching ground/power noises calculation for pin grid array packages

  • Author

    Bedouani, M.

  • Author_Institution
    Bull Res. Center, Les Clayes sous Bois, France
  • fYear
    1993
  • fDate
    1-4 Jun 1993
  • Firstpage
    1039
  • Lastpage
    1044
  • Abstract
    The author presents basic electrical models to calculate equivalent inductances (noises) for a 179 pin grid array package as a function of ground/power/signals pin organizations. A full experimental inductances measurement based on time domain reflectometry and frequency method is also presented. A specific test vehicle was elaborated to avoid fixturing noise. Calculated and measured signal effective inductance values are compared. Each integrated circuit logic family has a specific switching point. Thus, adequate ground/power/signal organization depends on the technology used. For some logic families like TTL (transistor transistor logic) and DCFL in silicon and GaAs technologies, the switching point near the ground voltage indicates that the critical path is ground. On other hand, the internal switching current becomes comparable to the input buffers (30-50 mA/ns). Thus, the ground/signal/power organization of output buffers must take into account the internal logic I/O´s (input/outputs). The noises are as function of the number of IO buffers and internal logic IO gates
  • Keywords
    CMOS integrated circuits; equivalent circuits; inductance measurement; integrated circuit technology; integrated circuit testing; integrated logic circuits; noise; packaging; time-domain reflectometry; CMOS ICs; PGA package design; electrical models; high density integrated circuit design; inductances measurement; integrated circuit logic family; pin grid array packages; simultaneous switching ground/power noises calculation; time domain reflectometry; Electronics packaging; Frequency measurement; Integrated circuit measurements; Integrated circuit noise; Integrated circuit packaging; Integrated circuit synthesis; Integrated circuit technology; Logic; Switching circuits; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1993. Proceedings., 43rd
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-0794-1
  • Type

    conf

  • DOI
    10.1109/ECTC.1993.346724
  • Filename
    346724