• DocumentCode
    2305804
  • Title

    Diagnostic tests for communicating nondeterministic finite state machines

  • Author

    Belhassine-Cherif, Rim ; Ghedamsi, Abderrazak

  • Author_Institution
    ENIT, Le Belvedere, Tunisia
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    424
  • Lastpage
    429
  • Abstract
    Systematic test sequence generation for conformance testing of communication protocol implementations, has been an active research area during the last decade. Methods were developed to produce optimized test sequences for detecting faults in such systems. However the application of these methods gives only limited information about the location of detected faults. In this paper we propose a complementary step, which localizes the fault, once detected. It consists of a generalized diagnostic algorithm for the case where distributed system specifications (implementations) are given in the form of communicating nondeterministic finite state machines. Such algorithm localizes the faulty transition once the fault has been detected. The algorithm guarantees the correct diagnosis of any single (output and/or transfer) fault. A simple example is used to demonstrate the functioning of the proposed algorithm. The complexity of each step in the algorithm and hence, the overall complexity are calculated
  • Keywords
    conformance testing; fault diagnosis; fault location; finite state machines; program testing; sequences; communicating nondeterministic finite state machines; communication protocol implementations; complexity; conformance testing; diagnostic tests; distributed system specifications; fault detection; generalized diagnostic algorithm; optimized test sequences; software domain; test sequence generation; Artificial intelligence; Automata; Fault detection; Fault diagnosis; Joining processes; Medical diagnostic imaging; Protocols; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computers and Communications, 2000. Proceedings. ISCC 2000. Fifth IEEE Symposium on
  • Conference_Location
    Antibes-Juan les Pins
  • Print_ISBN
    0-7695-0722-0
  • Type

    conf

  • DOI
    10.1109/ISCC.2000.860675
  • Filename
    860675