• DocumentCode
    230587
  • Title

    Pulsed field emission imaging of double-gate metal nano-tip arrays: Impact of emission current and noble gas conditioning

  • Author

    Kanungo, P. Das ; Helfenstein, Patrick ; Guzenko, V.A. ; Lee, Chi-Kwan ; Tsujino, Soichiro

  • Author_Institution
    Lab. of Micro & Nanotechnol., Paul Scherrer Inst., Villigen, Switzerland
  • fYear
    2014
  • fDate
    6-10 July 2014
  • Firstpage
    29
  • Lastpage
    30
  • Abstract
    We studied the field emission characteristics of stacked-double gate all metal nano-tip arrays for the un-collimated emission current ranging from a few μA to 0.4 mA. Conditioning a 4×104-tip device in low-pressure neon gas ambient and applying long switching pulses, up to ~80 μA field emission current with the transverse energy spread well below 1 eV was demonstrated.
  • Keywords
    field emission; free electron lasers; double gate metal nanotip arrays; field emission current; noble gas conditioning; pulsed field emission imaging; stacked double gate; Electronic mail; Logic gates; RNA; THz vacuum amplifiers; double-gate field emitter arrays; field emission; free electron laser; metal nano-tip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2014 27th International
  • Conference_Location
    Engelberg
  • Print_ISBN
    978-1-4799-5306-6
  • Type

    conf

  • DOI
    10.1109/IVNC.2014.6894744
  • Filename
    6894744
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=230587