DocumentCode :
2305969
Title :
Manufacture of advanced Cu-PI multi chip modules
Author :
Rao, Ven ; Hutchins, Don ; Reagan, John ; Scheid, Dave ; Streif, Randy ; Syrstad, Tom ; Eggerding, Carl ; Redmond, Tom
Author_Institution :
IBM Corp., East Fishkill, NY, USA
fYear :
1993
fDate :
1-4 Jun 1993
Firstpage :
920
Lastpage :
934
Abstract :
A process has been developed for fabricating advanced Cu-PI multi chip modules (MCMs). This technology has been in prototype manufacturing for three years. Several thousand MCM´s or interposers, with exceptional AC and DC characteristics, have been manufactured and used in prototype systems. Each interposer allows interconnection for 4 integrated circuits, 18 chip resistors, and 9 decoupling chip capacitors. Components are attached to the interposer by a flip-chip (or C4) process. The interposers are in turn attached to larger substrates. Interposers are made up of multilayer thin film (MLTF) on a multilayer glass ceramic substrate. The MLTF consists of 7 metal layers (4 wiring, 3 power-ground). An interposer measures less than 25 mm on a side. For four signal layers, the interposer provides as much as 500 cm/cm2 or roughly 20 meters of wiring. There are several thousand signal and power vias in each interposer, for a total via density in excess of 800 vias/cm2. The physical and electrical characteristics of the interposers, the process and test details, manufacturing information, and reliability data are presented
Keywords :
circuit reliability; copper; integrated circuit manufacture; integrated circuit testing; microassembling; multichip modules; polymer films; production testing; substrates; surface mount technology; thin film circuits; C4 process; Cu; Cu-PI multichip modules; IC interconnection; MCM manufacture; flip-chip process; integrated circuit; interposers; multilayer glass ceramic substrate; multilayer thin film; reliability data; Capacitors; Integrated circuit interconnections; Integrated circuit technology; Manufacturing; Nonhomogeneous media; Prototypes; Resistors; Substrates; Thin film circuits; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1993. Proceedings., 43rd
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0794-1
Type :
conf
DOI :
10.1109/ECTC.1993.346742
Filename :
346742
Link To Document :
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