• DocumentCode
    230639
  • Title

    Peculiarities of electron field emission from SiGe nanoislands

  • Author

    Evtukh, A. ; Steblova, O. ; Yukhimchuk, O. ; Yilmazoglu, Oktay ; Hartnagel, H. ; Mimura, Hidenori

  • Author_Institution
    V. Lashkaryov Inst. of Semicond. Phys., Kiev, Ukraine
  • fYear
    2014
  • fDate
    6-10 July 2014
  • Firstpage
    90
  • Lastpage
    91
  • Abstract
    The electron field emission and photoassisted field emission from SiGe nanoisland formed by MBE growth are investigated. There are two types of nanoislands, namely the conical and pyramidal ones with different heights. Two slopes in emission current-voltage characteristics in Fowler-Nordheim coordinates were observed and is explained by emission from different SiGe nanoislands. The increase of emission current and decrease the slope of curve in F-N coordinates under green light illumination has been revealed. The model of electron field emission and photoemission from SiGe nanoislands based on energy band diagram of Si-Ge heterostructure has been proposed.
  • Keywords
    Ge-Si alloys; band structure; electron field emission; molecular beam epitaxial growth; nanofabrication; nanostructured materials; photoemission; semiconductor epitaxial layers; semiconductor growth; semiconductor materials; Fowler-Nordheim coordinates; MBE growth; Si-Ge; conical nanoisland; electron field emission; emission current; emission current-voltage characteristics; energy band diagram; green light illumination; molecular beam epitaxial growth; photoassisted field emission; photoemission; pyramidal nanoisland; silicon-germanium heterostructure; silicon-germanium nanoislands; SiGe; electric field enhancement coefficient; electron field emission; nanoislands; photoassisted field emission; work function;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2014 27th International
  • Conference_Location
    Engelberg
  • Print_ISBN
    978-1-4799-5306-6
  • Type

    conf

  • DOI
    10.1109/IVNC.2014.6894772
  • Filename
    6894772