DocumentCode :
2306581
Title :
Reliability qualification of a demountable packaging technology
Author :
Matta, Farid ; Afshari, Bahram ; Pendse, Raj ; Karnezos, Marcos
Author_Institution :
Hewlett-Packard Co., Palo Alto, CA, USA
fYear :
1993
fDate :
1-4 Jun 1993
Firstpage :
679
Lastpage :
685
Abstract :
Demountable TAB (or DTAB) is a detachable, solderless, IC packaging technology based on using separable pressure contacts directly between the package and the substrate (e.g. PC board). Developmental reliability testing was used as a principal tool in the engineering of DTAB. Nevertheless, upon completion of the development effort, the technology was required to pass a formal qualification with pre-set sample sizes, strife conditions, and allowable failure rates. Because of the fundamental differences between DTAB and conventional packages, new approaches were required in the design of the tests and test protocols. The qualification vehicle was a 432-lead package containing a 14-mm sq. chip and a 48-mm sq. TAB frame, both designed specifically for the purpose. The qualification program consisted of two distinct batteries of tests, one for the package, and the other for the package-to-board contacts
Keywords :
ageing; circuit reliability; electric connectors; encapsulation; failure analysis; humidity; integrated circuit technology; integrated circuit testing; life testing; printed circuit testing; tape automated bonding; thermal shock; DTAB; HAST; PCB; accelerated stress testing; connector tests; corrosive atmosphere; demountable TAB; demountable packaging technology; detachable solderless IC packaging; elevated humidity; elevated temperature; encapsulation die attach; failure mechanisms; failure rates; inner-lead bonds; package-to-board contacts; qualification program; reliability qualification; reliability testing; separable pressure contacts; thermal aging; thermal shock; Aging; Assembly; Circuit testing; Costs; Electric shock; Humidity; Integrated circuit packaging; Qualifications; Temperature; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1993. Proceedings., 43rd
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0794-1
Type :
conf
DOI :
10.1109/ECTC.1993.346776
Filename :
346776
Link To Document :
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