• DocumentCode
    2306627
  • Title

    Improved Channel Estimation Using Wavelet Denoising for OFDM and OFDMA Systems

  • Author

    Wang Xue ; Zhao Lin-jing ; Li Jian-Dong

  • Author_Institution
    Inf. Sci. Inst., Xidian Univ., Xi´an
  • fYear
    2009
  • fDate
    26-29 May 2009
  • Firstpage
    129
  • Lastpage
    133
  • Abstract
    Least Square (LS) channel estimation has been widely used in OFDM (Orthogonal Frequency Division Multiplexing) and OFDMA (Orthogonal Frequency Division Multiplexing Access) systems. However, it´s rather sensitive to Guassian white noise. In this paper, we present a new algorithm which deals with the LS estimation results through wavelet shrinkage denoising based on Steinpsilas unbiased risk estimation (SURE) criterion. This algorithm can effectively remove the influence of noise in the channels and minimize the estimation risk. Consequently, the sensitivity to noise of LS estimation is diminished. Simulation in the scenario of IEEE802.16 downlink transmission shows that the proposed algorithm has significant advantage over LS and modified LS estimators.
  • Keywords
    OFDM modulation; WiMax; channel estimation; frequency division multiple access; least squares approximations; Guassian white noise; IEEE802.16 downlink transmission; OFDM systems; OFDMA systems; Stein unbiased risk estimation criterion; WiMax; improved channel estimation; least square channel estimation; noise removal; orthogonal frequency division multiplexing access systems; orthogonal frequency division multiplexing systems; wavelet denoising; Broadband communication; Channel estimation; Degradation; Delay effects; Laboratories; Least squares approximation; Low-frequency noise; Noise reduction; OFDM; Signal to noise ratio; Channel estimation; OFDM; OFDMA; SURE; Wavelet denoising;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Information Networking and Applications Workshops, 2009. WAINA '09. International Conference on
  • Conference_Location
    Bradford
  • Print_ISBN
    978-1-4244-3999-7
  • Electronic_ISBN
    978-0-7695-3639-2
  • Type

    conf

  • DOI
    10.1109/WAINA.2009.51
  • Filename
    5136636