Title :
A drawback of converting to a low stress molding compound
Author :
Virojanapa, Chumroon ; Hadkeaw, Manit ; Kane, Didier
Author_Institution :
AT&T Microelectron., Allentown, PA, USA
Abstract :
This paper presents a failure mechanism resulting in interfacial cracks and broken wedge bonds that was occasionally encountered on some plastic DIPs with large leadframe paddle upon conversion to a lower stress molding compound. The root cause of the problem was a pull force during leads forming in excess of the strength of the center lead/wedge bond/molding compound structure. The paper-shows how acoustic microscopy and finite element analysis enabled the elimination of the problem via optimization of the packaging processes and redesign of some leadframes
Keywords :
acoustic microscopy; circuit reliability; cracks; failure analysis; finite element analysis; integrated circuit technology; packaging; FEM; acoustic microscopy; broken wedge bonds; failure mechanism; finite element analysis; interfacial cracks; leadframe paddle; leads forming; low stress molding compound; optimization; plastic DIPs; pull force; Electronics packaging; Failure analysis; Finite element methods; Integrated circuit packaging; Lead compounds; Optical microscopy; Plastics; Semiconductor device manufacture; Semiconductor device packaging; Thermal stresses;
Conference_Titel :
Electronic Components and Technology Conference, 1993. Proceedings., 43rd
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0794-1
DOI :
10.1109/ECTC.1993.346779