DocumentCode :
230664
Title :
In situ oxidizing environment field emission study of Mo nanowall cold cathode
Author :
Yan Shen ; Xu, N.S. ; Deng, S.Z. ; Yu Zhang ; Fei Liu ; Jun Chen
Author_Institution :
State Key Lab. of Optoelectron. Mater. & Technol., Univ., Guangzhou, China
fYear :
2014
fDate :
6-10 July 2014
Firstpage :
127
Lastpage :
128
Abstract :
Mo nanowalls with high and stable field emission properties have been synthesized by a thermal vapor deposition method, and it shows strong immunity to the in situ oxidizing environment. After pure O2 exposure, the degradation of emission current was only 42.31% when the vacuum pressure increased from 2×10-6 Pa to 5×10-4 Pa. For those exposures over 1×10-3 Pa, the cathode´s total recover was still possible. Moreover, only the extremely serious exposures could make the surface chemistry and geometrical structure be irreversibly destroyed. The wall-like structure and its excellent heat dissipation potential may be quite a big advantage, and hence such cold cathode could be beneficial to the device packaging in rough vacuum environment.
Keywords :
cathodes; field emission; field emitter arrays; molybdenum; surface chemistry; Mo; device packaging; emission current; geometrical structure; heat dissipation potential; in situ oxidizing environment field emission study; nanowall cold cathode; surface chemistry; thermal vapor deposition method; Thermal degradation; X-ray scattering; Field emission; Molybdenum nanowall; Oxygen exposure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2014 27th International
Conference_Location :
Engelberg
Print_ISBN :
978-1-4799-5306-6
Type :
conf
DOI :
10.1109/IVNC.2014.6894785
Filename :
6894785
Link To Document :
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