• DocumentCode
    2307347
  • Title

    Improving gold-silver wirebond integrity in plastic packages

  • Author

    Sow, Y.K. ; Yasmin, Ahmad ; Dias, Rajendra

  • Author_Institution
    Intel Technol., Penang, Malaysia
  • fYear
    1993
  • fDate
    1-4 Jun 1993
  • Firstpage
    341
  • Lastpage
    347
  • Abstract
    A gold-silver wire bond system is widely used as an interconnect between die and die attach paddle to allow stabilization of substrate voltage by connecting it with a capacitor to analog ground. Failure analysis tools and techniques used in determining the characteristics of die paddle ball bond failures are explained. Electrical test screens were evaluated to contain the failures. A comprehensive discussion of various factors influencing the integrity of gold wire ball bonds on silver plated die paddles of plastic packages is presented. Results are based on a series of matrix experiments focused on the effects of critical wire bond process parameters such as ultrasonic power, bond force and ball size ratio on these die paddle bonds prior to and after accelerated stress test. Leadframe conditions such as silver plating thickness and surface finish are also evaluated. Die paddle bond lift failures were found to be due to partial intermixing at the gold/silver interface under conditions of delamination at the molding compound/die paddle interface. Ball size ratio, ultrasonic bond power and silver surface finish were identified to be the most significant factors affecting the die paddle ball bond integrity after temperature cycle stressing. With the correct combination of material and bond process conditions, it was demonstrated that die paddle ball bonds can be made with high reliability
  • Keywords
    delamination; gold; integrated circuit testing; lead bonding; life testing; packaging; silver; ultrasonic applications; Au-Ag; accelerated stress test; ball bond failures; ball size ratio; bond force; delamination; die attach paddle; electrical test screens; failure analysis tools; gold-silver wirebond integrity; interconnect; lift failures; matrix experiments; partial intermixing; plastic packages; plating thickness; substrate voltage; surface finish; temperature cycle stressing; ultrasonic power; Bonding forces; Gold; Joining processes; Microassembly; Plastic packaging; Silver; Surface finishing; Testing; Voltage; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1993. Proceedings., 43rd
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-0794-1
  • Type

    conf

  • DOI
    10.1109/ECTC.1993.346822
  • Filename
    346822