DocumentCode :
2307621
Title :
CSTAR database for advanced test systems
Author :
Hunter, Camille S. ; Southard, Richard B.
Author_Institution :
IBM Corp., Hopewell Junction, NY, USA
fYear :
1993
fDate :
1-4 Jun 1993
Firstpage :
166
Lastpage :
168
Abstract :
The CSTAR (cards status tracking recording) database tracks inventory redesign/failure history of the field replaceable units (cards and components) that make up the VLSI device advanced test systems (ATS) that have been designed and manufactured at IBM, East Fishkill. CSTAR obsoletes the process of logging hardware failures in a notebook where inventory and failure-to-repair actions can not be easily identified. CSTAR provides an automatic serial number generator facility for new card tracking, status histories of all cards, SQL reports for analyzing failure histories for the most frequently used repair process, engineering change summaries per card, and a comprehensive user´s guide (on-line and hard copy.) CSTAR runs in a distributed environment with LANs providing the link to a centralized database enabling all information to be immediately available to all authorized users in the laboratory and manufacturing test areas. Since repair attempts now have a consistent approach, second and third shift problem take over is accelerated and simplified, and hardware maintenance programs are forecasted, there is enhanced equipment reliability by reduced unplanned maintenance and quicker turn around time
Keywords :
VLSI; circuit reliability; electronic engineering computing; failure analysis; integrated circuit testing; CSTAR database; East Fishkill; IBM; LANs; SQL; VLSI device advanced test systems; advanced test systems; automatic serial number generator facility; card tracking; cards status tracking recording; distributed environment; failure histories; failure history; failure-to-repair actions; field replaceable units; hard copy; inventory redesign; logging hardware failures; on-line; repair process; status histories; user´s guide; Data engineering; Databases; Failure analysis; Hardware; History; Information analysis; Maintenance; Manufacturing; System testing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1993. Proceedings., 43rd
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0794-1
Type :
conf
DOI :
10.1109/ECTC.1993.346837
Filename :
346837
Link To Document :
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