Title :
Bayesian approach of failure rate estimation in field conditions through accelerated testing
Author :
Gouno, E. ; Deleuze, G. ; Brizoux, M. ; Robert, C.
Author_Institution :
Dept. of Technol., Thomson-CSF/SCTF, Orsay, France
Abstract :
This paper proposes a new approach of electronic components reliability using Bayesian statistics. The purpose is to estimate the failure rate in use conditions through data from accelerated tests. Priors densities used in the model has been built with physics considerations and simulations. Furthermore, this work provided new forms of accelerated factors
Keywords :
Bayes methods; failure analysis; life testing; modelling; reliability; reliability theory; statistical analysis; Bayesian statistics; accelerated factors; accelerated test data; accelerated testing; electronic components reliability; failure rate estimation; field conditions; model; Acceleration; Bayesian methods; Humidity; Life estimation; Life testing; Plastics; Qualifications; Reliability engineering; Stress; Temperature;
Conference_Titel :
Electronic Components and Technology Conference, 1993. Proceedings., 43rd
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0794-1
DOI :
10.1109/ECTC.1993.346845
