• DocumentCode
    2308049
  • Title

    Trend Extraction of the MEMS Gyroscope´s Drift Based on EEMD

  • Author

    Zhang Yinqiang ; Wang Shourong ; Xia Dunzhu

  • Author_Institution
    Key Lab. of Micro-Inertial Instrum. & Adv. Navig. Technol., Southeast Univ., Nanjing, China
  • Volume
    3
  • fYear
    2010
  • fDate
    13-14 March 2010
  • Firstpage
    1050
  • Lastpage
    1053
  • Abstract
    The Micro Electro Mechanical System (MEMS) gyroscopes are widely used in many applications for the compact size and low cost. However, since the MEMS gyroscopes usually have large drift which affects the measuring precision, we need to extract the trend of drift signal and eliminate the determinate trend to reduce the disadvantageous affection. Generally, gyro´s drifts are a weak nonlinear and non-stationary random process. Thus, non-stationary time series analysis is needed. In this paper, we propose a novel approach based on the ensemble empirical mode decomposition (EEMD) to extract the trend item of the MEMS Gyroscope´s drift. The non-linear and non-stationary drift signals are decomposed into a series of intrinsic mode functions and a residual trend item by the EEMD. The method overcomes the shortcomings of the mode mixing and represents an improvement of the EMD method. The concrete steps of the proposed approach are presented and applied to a MEMS Gyroscope´s drift signals. The experiment result indicates that the method can effectively extract the trend of the drift.
  • Keywords
    gyroscopes; micromechanical devices; random processes; time series; EEMD; MEMS Gyroscope drift; drift signals; ensemble empirical mode decomposition; intrinsic mode functions; nonlinear random process; nonstationary random process; nonstationary time series analysis; Acoustic noise; Costs; Data mining; Educational technology; Gyroscopes; Instruments; Mechanical systems; Micromechanical devices; Navigation; Noise reduction; MEMS gyroscope; drift; ensemble empirical mode decomposition; time series; trend extraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Measuring Technology and Mechatronics Automation (ICMTMA), 2010 International Conference on
  • Conference_Location
    Changsha City
  • Print_ISBN
    978-1-4244-5001-5
  • Electronic_ISBN
    978-1-4244-5739-7
  • Type

    conf

  • DOI
    10.1109/ICMTMA.2010.654
  • Filename
    5460302