Title :
ABILBO: Analog BuILt-in block observer
Author :
Lubaszewski, M. ; Mir, S. ; Pulz, L.
Author_Institution :
Univ. Federal do Rio Grande do Sul, Porto Alegre, Brazil
Abstract :
This paper presents a novel multifunctional test structure called Analog BulLt-in Block Observer (ABILBO). This structure is based on analog integrators and achieves analog scan, test frequency generation and test response compaction. A high fault coverage was obtained by using a discrete switched-capacitor ABILBO for testing a biquad filter. The ABILBO area overhead and performance penalty can be very low if functional and testing circuitry are shared. This is typically the case of high order filters based on a cascade of biquads.
Keywords :
analogue integrated circuits; biquadratic filters; built-in self test; integrated circuit testing; ABILBO; analog integrators; analog scan; biquad filter; block observer; multifunctional test structure; test frequency generation; test response compaction; Analog circuits; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Frequency; Hardware; Proposals; Signal generators;
Conference_Titel :
Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-7597-7
DOI :
10.1109/ICCAD.1996.569917
