DocumentCode :
2308235
Title :
Predicted solar cell edge radiation effects
Author :
Gates, Markland T.
Author_Institution :
Boeing Defense & Space Group, Seattle, WA, USA
fYear :
1993
fDate :
10-14 May 1993
Firstpage :
1404
Lastpage :
1408
Abstract :
The Advanced Solar Cell Orbital Test (ASCOT) will test six types of solar cells in a high energy proton environment. During the design of the experiment a question was raised about the effects of proton radiation incident on the edge of the solar cells and whether edge radiation shielding was required. Historical geosynchronous data indicated that edge radiation damage is not detectable over the normal end of life solar cell degradation; however because the ASCOT radiation environment has a much higher and more energetic fluence of protons, considerably more edge damage is expected. A computer analysis of the problem was made by modeling the expected radiation damage at the cell edge and using a network model of small interconnected solar cells to predict degradation in the cell´s electrical output. The model indicated that the deepest penetration of edge radiation was at the top of the cell near the junction where the protons have access to the cell through the low density cell/cover adhesive layer. The network model indicated that the cells could tolerate high fluences at their edge as long as there was high electrical resistance between the edge radiated region and the contact system on top of the cell. The predicted edge radiation related loss was less than 2% of maximum power for GaAs/Ge solar cells. As a result, no edge radiation protection was used for ASCOT
Keywords :
III-V semiconductors; gallium arsenide; photovoltaic power systems; power engineering computing; proton effects; semiconductor device models; semiconductor device testing; solar cells; space vehicle power plants; Advanced Solar Cell Orbital Test; GaAs; computer analysis; edge radiation related loss; high electrical resistance; high energy proton environment; interconnected solar cells; low density cell/cover adhesive layer; predicted solar cell edge radiation effects; proton radiation effects; Computer networks; Degradation; Electric resistance; Photovoltaic cells; Power system modeling; Predictive models; Protons; Radiation detectors; Radiation effects; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
Conference_Location :
Louisville, KY
Print_ISBN :
0-7803-1220-1
Type :
conf
DOI :
10.1109/PVSC.1993.346911
Filename :
346911
Link To Document :
بازگشت